SiPM dToF LiDAR Platform from ON Semiconductor Provides Ready-to-Use Design for Industrial Range Finding Applications
                    
                    
                    The platform showcases direct Time-of-Flight LiDAR using ON Semiconductor's Silicon Photomultiplier (SiPM) sensor expertise
 

PHOENIX, Ariz. – Nov. 9, 2020 – ON Semiconductor (Nasdaq:ON), driving energy efficient innovations, has introduced a single point direct Time-of-Flight (dToF) LiDAR solution  enabled by the company's Silicon Photomultiplier (SiPM) technology.
 
The application of light detection and ranging, or LiDAR ,   is growing across all sectors, including robotics and industrial   proximity sensing where millimetre range accuracy is mandatory. It is   typically based upon the dToF method, which measures the time it takes   for a pulse of light, normally in the Near Infrared (NIR) wavelength   range, to travel to and from an object.
 
While the principle is simple, its application can pose challenges, for   example, environmental factors such as high levels of ambient solar   light. To determine range accurately, the receiver needs to capture as   much of the signal as possible. Traditional photodiodes suffer here, in   terms of response time and sensitivity. The Silicon Photomultiplier   (SiPM) sensor developed by ON Semiconductor, overcomes these shortfalls   by providing faster response times and high detection efficiency. The   reference platform uses the RB-Series, ON Semiconductor's second generation of SiPM sensors, which deliver improved performance in red and the NIR range.
 
The SiPM dToF LiDAR Platform  developed by ON Semiconductor provides a complete solution for low   cost, single point LiDAR that OEMs can adapt and take into production to   create industrial range finding applications. It includes the NIR laser   diode, SiPM sensor and optics, as well as the digital processing   necessary to convert the detected signals into elapsed time, and elapsed   time into distance.
 
To accelerate customers' time to market, ON Semiconductor has made all   of the design data for the reference platform available, covering the   schematics, BoM, gerber files, and PCB design files. A PC-based GUI is   also accessible, which provides a graphical representation of the   measurements over time. The histograms generated provide further   evidence of the system's capabilities in applications such as range   finding, collision detection and 3D mapping.
 
“Range finding using dToF LiDAR delivers on a critical need for many   applications, extending from autonomous navigation through mapping to   monitoring.  However, developing such a system based on dToF LiDAR can   be challenging,” said Wiren Perera who heads IoT at ON Semiconductor.   “This platform clearly demonstrates the effectiveness of this leadership   technology. The availability of a proven design enables our customers   to get to a proof of concept much faster, and rapidly deliver their   product to market.”
 
The SiPM dToF LiDAR Platform can detect objects at distances between 10   cm and 23 m. It offers an out-of-the-box experience using the provided   GUI, which allows engineers to start evaluating the technology   immediately. The design is FDA Class 1 certified and compliant with IEC /   EN 60825-1:2014 and 21 CFR 1040.10/ 1040.11 laser safety standards.